Quote Originally Posted by Computurd View Post
is there a way to show the maximum QD for the individual device?
The hIOmon software can be configured to collect "summary" metrics upon an individual file, process, and/or device basis:

http://www.hyperIO.com/hIOmon/hIOmon...zedMetrics.htm

If you are collecting summary metrics upon an individual process basis, then indeed the maximum QD metric within the "summary metrics" for the process will reflect the maximum seen for the respective process.

Similarly, if you are collecting summary metrics upon an individual file basis, then the maximum QD metric within the summary metrics for a particular file reflects the max seen for the respective file.

And of course, the same applies for the summary metrics collected upon an individual device basis. In the case of summary metrics for a specific "physical device" (i.e., at the "physical disk" level within the operating system), the max QD is that seen for/at the respective device (regardless of the "source", i.e., whichever process initiated the I/O operation).

So essentially the summary metrics for a file, process, or device reflect those metrics that pertain just to that file, process, or device.

As noted above, this is all configurable and moreover allows you to observe what is occurring for a particular file, process, or device upon an individual file, process, and device basis respectively.

Oops, just saw your edit. Hopefully the above provides further confirmation.

Also, you raise a very good point about distinguishing between average and maximum QD.