They bake the drives to do accelerated lifetime testing.
i understand the process. much like they test many many other devices.
im not inferring that they are spec'ing the drive at those temps. they have their own temp specs rated.

the point is this: they are doing accelerated writes in a very small amount of time (worst case scenario again) and doing it under extreme conditions that 99 percent of the drives will never see.

note: also they do non-accelerated room temp testing. they cover both bases here.


At that point, it would also be interesting to test whether all the data can be read back, and to let it sit for a while and test again.
yes this would be the most interesting, because that is the root cause of nand death...it cant hold the electron anymore...but if it can hold it short periods of time thats easy, but with gate degradation that is where the ability to maintain long term retention should become comprimised, at least initially. that would be the beggining stages i would imagine.extended torture write testing, then baking, then non accelerated room temp testing, THEN doing a bit error test after extended rest time-- should just about do it and catch the error rate under pretty much any scenario.