Yes, after supplying 1.300v - 1.349v to the vcore
Yes, after supplying 1.350v - 1.399v to the vcore
Yes, after supplying 1.400v - 1.449v to the vcore
Yes, after supplying 1.450v - 1.499v to the vcore
Yes, after supplying 1.500v - 1.599v to the vcore
Yes, after supplying 1.600v or more to the vcore
No, and I run my vcore at 1.300v - 1.349v 24/7
No, and I run my vcore at 1.350v - 1.399v 24/7
No, and I run my vcore at 1.400v - 1.449v 24/7
No, and I run my vcore at 1.450v or more 24/7
It would make sense for a standard methodology to test these chips. That would require a set of testing from the ground up for each brand new chip. I know it's idealistic, because it would also require pushing them to high volts to get the degradation.
Out of curiosity, what would people suggest as a method to confirm degradation? What is acceptable proof? I'm assuming there's a range of opinion here.
Last edited by mrcape; 03-30-2008 at 06:47 PM.
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