You have a valid request dekruyter. Unfortunately, the best we can do with a single CPU is hope it will respond well. There is no method to fundamentally ascertain the degree of CPU declination with regards to a singular sample. One can not apply statistical determination at that level.
One can only speculate. I was attempting to show the method that is used (by CPU design engineers) to bring about CPU degradation in a standard population of testing. Raising the voltages and setting the environment for failure beyond a point of error.
The simple request that is sought in this thread is not (in my view) possible. One can only theorize maximal voltages. You will find some who are able to run 1.6V (on air) without any mid-long-term effects (5 or more years) and others with the same fab/batch experiencing issues with lesser settings.
In the industry, the prevailing view has usually been a +.2V on .65nm products with decent core thermal extraction via air/medium water. +.4V on .65nm products with high end water and +.5 on LN/High end thermal removal with freeze attributes holding discharge in a more marginalized environment.
It's still a crap shoot though.
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